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 CD-RW mechanisms

CD-RW compatibility
 

 
The added value of CD-RW compatible mechanisms

The CD reflectance specifications : 70% minimum for lands, 28% maximum for pits, was introduced to allow the relatively insensitive photodiodes of the early eighties to read the signal pattern reliably. But with today’s photodiodes able to detect much smaller reflectance differences, these stringent specifications are no longer necessary. Moreover, for CD-RW, the specifications leave little energy in reserve (only 30% after 70% is reflected) to produce phase changes in the recording material.
 
 
The CD-RW recording layer (a mixture of silver, indium, antimony and tellurium) has a maximum reflectance (in the crystalline phase) of about 20% and a minimum reflectance (in the amorphous phase) of only 5%. The CD-ReWritable system, therefore, works at reflectance of slightly less than one-third of the original CD figure. With modern photodiodes, this presents no problem. Hence the advantage of CD-ReWritable compatible mechanisms which do include these new generation photodiodes with high sensitivity. As a result, these mechanisms can read all CD related media, i.e. CD DA, CD-R, CD-RW…Besides, these new sensitive photodiodes are important to reduce laser light on CD-RW discs and so to improve laser lifetime.
 
 


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